The Determination of Inner Surfaces in Composites by X-Ray Refraction

A X-ray refraction method is presented which reveals the inner surface and interface concentrations of nanometer dimensions due to the short X-ray wavelength near 10 μm. Sub-micron particle, crack and pore sizes are easily determined by "X-ray Refractometry" without destroying the structure by cutting or polishing for microscopic techniques. Beyond this analytical potential for (integral) analysis, spatial resolution can be achieved, when the sample is scanned across a narrow X-ray beam. This is possible within relatively short time, as the scattered intensity at very small angles of few minutes of arc is much higher than in conventional wide angle X-ray scattering (WAXS). In this case we have "X-ray Refraction Topography". The performance of the method is demonstrated by partly damaged samples of composites.